Microscopy & SEM
Services
ASTON's Advanced Microscopy Laboratory is equipped
with research optical microscopes with high resolution digital photography;
a scanning electron microscope (SEM) equipped with a light element
energy dispersive X-ray spectrometer (EDS); digital image analyzer
and an ultra light load Knoop/Vickers microhardness tester.
Scanning Electron Microscopy
ASTON's high-resolution scanning electron microscope
(SEM) is a powerful tool used in failure analysis. The SEM can show
the fracture origin and detailed fracture features. This is invaluable
in determining the type of fracture that has occurred and in reconstructing
the sequence of events involved in the failure.
Our SEM provides a number of benefits:
• Detailed three-dimensional images at high
magnifications that allow us to characterize fracture surfaces,
observe microstructures at extremely high magnifications and view
otherwise unseen surface features.
• A large sample chamber that minimizes the
risk of sawing through a fracture origin or other area of interest.
• A high performance light element detecting
energy dispersive spectrometer to detect elements with atomic numbers
of boron and greater.
• Elemental dot mapping
• Backscatter imaging
• SLICE EDS spectral matching database software
Technology Spotlight
Our Leica S200 scanning electron microscope
is well equipped with a large capacity stage, light element EDS detector,
dot mapping capabilities
and backscatter imaging. Our recently upgraded EDS system provides
increased count rates and stability. We are assisting in developing
the database for our new SLICE software. SLICE will instantly compare
and match an unknown EDS sample to any of thousands of known reference
standards and materials. Stay tuned for more news as we bring this
on-line and expand our database.
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